Seminar: Challenges Near the Limit of CMOS Scaling” by Yuan Taur
Posted by Mark Bussert in noticesSeminar based on IEEE Expert Now Course
Seminar Title: “Challenges Near the Limit of CMOS Scaling” by Yuan Taur
Seminar Moderator: Kunal Parekh, Micron Technology, Inc.
When: December 2, 2009, 2:40pm-4:10pm
Where: Room 106, MEC (Micron Engineering Center) at Boise State University
Fee: None (sponsored by IEEE EDS Boise Chapter)
As a part of the EDS Boise Chapter initiative to promote technical activities in Treasure Valley, we invite you to attend the seminar (short course) prepared by Dr. Yuan Taur for IEEE Expert Now. You will have an opportunity to learn about new materials/devices required for continued CMOS scaling to 10-nm regime and participate in discussions led and moderated by an area expert.
IEEE Expert Now Courses are based on the best IEEE educational tutorials and workshops (http://www.ieee.org/web/education/Expert_Now_IEEE/index.html). Attendees will have the option of receiving Continuing Education Units (CEUs) for attending the event (through The International Association of Continuing Education and Training, IACET).
We hope to provide quality educational materials via the IEEE Program to enhance local educational activities and further support the value of IEEE Membership for members in Boise area.
Thanks,
Shyam Surthi – EDS Membership Chair
Steven Groothuis – EDS Chapter Chair
“The IEEE has been approved as an Authorized Provider by the International Association for Continuing Education and Training (IACET). In obtaining this approval, the IEEE has demonstrated that it complies with the IACET Standards which are widely recognized as standards of good practice internationally. As a result of their Authorized Provider membership status, IEEE is authorized to offer IACET CEUS for its programs that qualify under the IACET Standards.”
IEEE IACET CEU Provider #1001255
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